लोड हो रहा है...
Advances in x-ray diffractometry and x-ray spectrography: a volume of fifteen selected reprints from philips laboratories Irvington-on Hudson, New York, USA
| अन्य लेखक: | Parrish, william., ed |
|---|---|
| स्वरूप: | Printed Book |
| भाषा: | English |
| प्रकाशित: |
Eindhoven
Centrex Publishing Cp.
1962
|
| विषय: |
समान संसाधन
-
X-ray optics and X-ray microanalysis.
प्रकाशित: (1963) -
APPLIED X-RAYS
द्वारा: CLARK,GEORGE.L
प्रकाशित: (1955) -
Applied X-rays.
द्वारा: Clark, George L.
प्रकाशित: (1955) -
Applied x-rays
द्वारा: Clark, George L
प्रकाशित: (1955) -
THE ENCYCLOPEDIA OF X - RAYS AND GAMMA RAYS
प्रकाशित: (1963)