Cargando...
Advances in x-ray diffractometry and x-ray spectrography: a volume of fifteen selected reprints from philips laboratories Irvington-on Hudson, New York, USA
| Outros autores: | Parrish, william., ed |
|---|---|
| Formato: | Printed Book |
| Idioma: | English |
| Publicado: |
Eindhoven
Centrex Publishing Cp.
1962
|
| Subjects: |
Títulos similares
-
X-ray optics and X-ray microanalysis.
Publicado: (1963) -
APPLIED X-RAYS
por: CLARK,GEORGE.L
Publicado: (1955) -
Applied X-rays.
por: Clark, George L.
Publicado: (1955) -
Applied x-rays
por: Clark, George L
Publicado: (1955) -
THE ENCYCLOPEDIA OF X - RAYS AND GAMMA RAYS
Publicado: (1963)