Lanean...
Advances in x-ray diffractometry and x-ray spectrography: a volume of fifteen selected reprints from philips laboratories Irvington-on Hudson, New York, USA
| Beste egile batzuk: | |
|---|---|
| Formatua: | Printed Book |
| Hizkuntza: | English |
| Argitaratua: |
Eindhoven
Centrex Publishing Cp.
1962
|
| Gaiak: |
PHY
| Sailkapena: |
548.83 PAR |
|---|---|
| Alea | Egoera zuzenean ez dago erabilgarri |