Parrish, w. (1962). Advances in x-ray diffractometry and x-ray spectrography: A volume of fifteen selected reprints from philips laboratories Irvington-on Hudson, New York, USA. Centrex Publishing Cp.
Citação norma ChicagoParrish, william. Advances in X-ray Diffractometry and X-ray Spectrography: A Volume of Fifteen Selected Reprints from Philips Laboratories Irvington-on Hudson, New York, USA. Eindhoven: Centrex Publishing Cp, 1962.
Citação norma MLAParrish, william. Advances in X-ray Diffractometry and X-ray Spectrography: A Volume of Fifteen Selected Reprints from Philips Laboratories Irvington-on Hudson, New York, USA. Centrex Publishing Cp, 1962.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.