Cita APA

Parrish, w. (1962). Advances in x-ray diffractometry and x-ray spectrography: A volume of fifteen selected reprints from philips laboratories Irvington-on Hudson, New York, USA. Centrex Publishing Cp.

Citación estilo Chicago

Parrish, william. Advances in X-ray Diffractometry and X-ray Spectrography: A Volume of Fifteen Selected Reprints from Philips Laboratories Irvington-on Hudson, New York, USA. Eindhoven: Centrex Publishing Cp, 1962.

Cita MLA

Parrish, william. Advances in X-ray Diffractometry and X-ray Spectrography: A Volume of Fifteen Selected Reprints from Philips Laboratories Irvington-on Hudson, New York, USA. Centrex Publishing Cp, 1962.