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Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials /
| Autor Principal: | |
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| Formato: | Printed Book |
| Idioma: | English |
| Publicado: |
New York :
Springer-Verlag,
1984.
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| Subjects: |
PHY
| Número de Clasificación: |
530.4 WAS |
|---|---|
| Copia | Live Status Unavailable |