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Foundations of statistical inference: proceedings of the Shoresh conference 2000

Bibliographic Details
Main Author: Ed by Haitovsky, Yoel
Other Authors: Lerche, Hans Rudolf, Ritov, Yaacov
Format: Printed Book
Language:English
Published: Heidelberg Physica-Verlag 2003
Subjects:
Description
Physical Description:xi,230p.
ISBN:3-7908-0047-3