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Foundations of statistical inference: proceedings of the Shoresh conference 2000

Bibliographic Details
Main Author: Ed by Haitovsky, Yoel
Other Authors: Lerche, Hans Rudolf, Ritov, Yaacov
Format: Printed Book
Language:English
Published: Heidelberg Physica-Verlag 2003
Subjects:

STA

Holdings details from STA
Call Number: 519.226 HAI
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