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Software reliability measurement, prediction, application

Bibliographic Details
Main Author: Musa, John D.
Other Authors: Iannino, Anthony, Okumoto, Kazuhira
Format: Printed Book
Language:English
Published: New York McGraw-Hill 1987
Series:McGraw-Hill series in software engineering and technology
Subjects:

STA

Holdings details from STA
Call Number: 519.68 MUS;1
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