Yüklüyor......
Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989
| Yazar: | Sumib, K. [ed.] (ed.by) |
|---|---|
| Müşterek Yazar: | International conference on the science and technology of defect control in semiconductors |
| Materyal Türü: | Printed Book |
| Dil: | English |
| Baskı/Yayın Bilgisi: |
Amsterdam
North-Holland
1990
|
| Konular: |
Benzer Materyaller
-
Photoinduced defects in semiconductors
Yazar:: Redfield, David
Baskı/Yayın Bilgisi: (1996) -
Photoinduced defects in semiconductors /
Yazar:: Redfield, David
Baskı/Yayın Bilgisi: (1996) -
Defects control in semiconductors: Proceedings of the conference on the science and technology of defect control in semiconductors,...
Baskı/Yayın Bilgisi: (1990) -
Extended defects in semiconductors : electronic properties, device effects and structures /
Yazar:: Holt, D. B.
Baskı/Yayın Bilgisi: (2007) -
Extended defects in semiconductors: electronic properties, device effects and structures
Yazar:: Holt, D. B. and Yacobi, B. G.
Baskı/Yayın Bilgisi: (2007)