Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989

Podrobná bibliografie
Hlavní autor: Sumib, K. [ed.] (ed.by)
Korporativní autor: International conference on the science and technology of defect control in semiconductors
Médium: Printed Book
Jazyk:English
Vydáno: Amsterdam North-Holland 1990
Témata:
Semiconductors - defect control

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