載入...
Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989
主要作者: | Sumib, K. [ed.] (ed.by) |
---|---|
企業作者: | International conference on the science and technology of defect control in semiconductors |
格式: | Printed Book |
語言: | English |
出版: |
Amsterdam
North-Holland
1990
|
主題: |
相似書籍
-
Photoinduced defects in semiconductors
由: Redfield, David
出版: (1996) -
Photoinduced defects in semiconductors /
由: Redfield, David
出版: (1996) -
Defects control in semiconductors: Proceedings of the conference on the science and technology of defect control in semiconductors,...
出版: (1990) -
Extended defects in semiconductors : electronic properties, device effects and structures /
由: Holt, D. B.
出版: (2007) -
Extended defects in semiconductors: electronic properties, device effects and structures
由: Holt, D. B. and Yacobi, B. G.
出版: (2007)