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Electrical conduction and dielectrical behavior of thin films of vaccum evaporated amorphus silicon, Hydrogenate amorphus silicon and chemically deposite cadmium sheets

Detalhes bibliográficos
Autor principal: Rajeev Kumar K.
Formato: Ph.D Thesis
Idioma:English
Publicado em: Kochi Dept. of Physics - CUSAT 1989
Assuntos:

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