Infrared ellipsometry on semiconductor layer structures: Phonons, plasmons, and polaritons

Míreanna Comhchosúla

• Ellipsometry: proceedings of the third international conference on wllipsometry
  Foilsithe: (1976)
• Ellipsometry at the nanoscale/
  Foilsithe: (2012)
• Spectroscopic ellipsometry study of barrier width effect in self-organized InGaAs/GaAsQDs laser diodes /
• Study of surface plasmon polaritons in gyrotropic and semiconductor nanostructures/
  le: Gishamol Mathew, Researcher, et al.
  Foilsithe: (2015)
• Study of surface plasmon polaritons in dielectric/metal multilayer structures/
  le: Anju Babu, Researcher, et al.
  Foilsithe: (2014)