Infrared ellipsometry on semiconductor layer structures: Phonons, plasmons, and polaritons

Eitemau Tebyg

• Ellipsometry: proceedings of the third international conference on wllipsometry
  Cyhoeddwyd: (1976)
• Ellipsometry at the nanoscale/
  Cyhoeddwyd: (2012)
• Spectroscopic ellipsometry study of barrier width effect in self-organized InGaAs/GaAsQDs laser diodes /
• Study of surface plasmon polaritons in gyrotropic and semiconductor nanostructures/
  gan: Gishamol Mathew, Researcher, et al.
  Cyhoeddwyd: (2015)
• Study of surface plasmon polaritons in dielectric/metal multilayer structures/
  gan: Anju Babu, Researcher, et al.
  Cyhoeddwyd: (2014)