Skip to content
VuFind
Language
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文(繁體)
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
Search
Infrared ellipsometry on semic...
Cite this
Email this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
permanent_link
Loading...
Infrared ellipsometry on semiconductor layer structures: Phonons, plasmons, and polaritons
Bibliographic Details
Main Author:
Schubert, Mathias
Format:
Printed Book
Published:
Springer (India) Pvt. Ltd., New Delhi
2004
Subjects:
Ellipsometry
Holdings
Description
Similar Items
Staff View
Description
Physical Description:
190
ISBN:
9783540232490
Similar Items
Ellipsometry: proceedings of the third international conference on wllipsometry
Published: (1976)
Ellipsometry at the nanoscale/
Published: (2012)
Spectroscopic ellipsometry study of barrier width effect in self-organized InGaAs/GaAsQDs laser diodes /
Study of surface plasmon polaritons in gyrotropic and semiconductor nanostructures/
by: Gishamol Mathew, Researcher, et al.
Published: (2015)
Study of surface plasmon polaritons in dielectric/metal multilayer structures/
by: Anju Babu, Researcher, et al.
Published: (2014)
Loading...