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Accelerated testing : statistical models, test plans and data analyses

Bibliografiske detaljer
Hovedforfatter: Nelson , Wayne B
Format: Printed Book
Udgivet: Hoboken, New Jersey Wiley-Interscience 2004
Serier:Wiley series in probability and statistics
Fag:
Beskrivelse
Fysisk beskrivelse:601
ISBN:9780471697367