Lanean...
Speckle metrology /
| Beste egile batzuk: | |
|---|---|
| Formatua: | Printed Book |
| Hizkuntza: | English |
| Argitaratua: |
New York :
Marcel Dekker,
c1993.
|
| Saila: | Optical engineering (Marcel Dekker, Inc.) ;
v. 38. |
| Gaiak: | |
| Sarrera elektronikoa: | Publisher description |