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Semiconductor material and device characterization /
| Hoofdauteur: | |
|---|---|
| Formaat: | Printed Book |
| Gepubliceerd in: |
[Piscataway, NJ] : Hoboken, N.J. :
IEEE Press ; Wiley,
c2006.
|
| Editie: | 3rd ed. |
| Onderwerpen: | |
| Online toegang: | http://www.loc.gov/catdir/enhancements/fy0645/2005048514-d.html http://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.html http://www.loc.gov/catdir/enhancements/fy0654/2005048514-b.html |