Schroder, D. K. (2006). Semiconductor material and device characterization (3rd ed.). IEEE Press ; Wiley.
Chicago Edition CitationSchroder, Dieter K. Semiconductor Material and Device Characterization. 3rd ed. [Piscataway, NJ] : Hoboken, N.J.: IEEE Press ; Wiley, 2006.
MLA citiranjeSchroder, Dieter K. Semiconductor Material and Device Characterization. 3rd ed. IEEE Press ; Wiley, 2006.
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