Reliability and Life Testing

Xehetasun bibliografikoak
Egile nagusia: Sinha,S.K
Formatua: Printed Book
Hizkuntza:English
Argitaratua: New Delhi: Wiley Eastern Limited, 1986.
Edizioa:First Edition.
Gaiak:
Reliability Theory-Statistics; Exponential Failure Model, Gamma and Weibull Distributions.
Gamma and Weibull Distributions
Bayesian Intervals for Paarameters and Reliability

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