In situ real time characterization of thin films / edited by Orlando Auciello, Alan R. Krauss.

Detalhes bibliográficos
Outros Autores: Auciello, Orlando, Krauss, Alan Robert
Formato: Printed Book
Publicado em: New York : Wiley, c2001.
Assuntos:
Thin films.
Acesso em linha:http://www.loc.gov/catdir/bios/wiley043/00025162.html
http://www.loc.gov/catdir/description/wiley035/00025162.html
http://www.loc.gov/catdir/toc/onix06/00025162.html

Internet

http://www.loc.gov/catdir/bios/wiley043/00025162.html
http://www.loc.gov/catdir/description/wiley035/00025162.html
http://www.loc.gov/catdir/toc/onix06/00025162.html

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