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In situ real time characterization of thin films / edited by Orlando Auciello, Alan R. Krauss.
| Altri autori: | , |
|---|---|
| Natura: | Printed Book |
| Pubblicazione: |
New York :
Wiley,
c2001.
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| Soggetti: | |
| Accesso online: | http://www.loc.gov/catdir/bios/wiley043/00025162.html http://www.loc.gov/catdir/description/wiley035/00025162.html http://www.loc.gov/catdir/toc/onix06/00025162.html |