In situ real time characterization of thin films / edited by Orlando Auciello, Alan R. Krauss.

Sonraí Bibleagrafaíochta
Údair Eile: Auciello, Orlando, Krauss, Alan Robert
Formáid: Printed Book
Foilsithe: New York : Wiley, c2001.
Ábhair:
Thin films.
Rochtain Ar Líne:http://www.loc.gov/catdir/bios/wiley043/00025162.html
http://www.loc.gov/catdir/description/wiley035/00025162.html
http://www.loc.gov/catdir/toc/onix06/00025162.html

Idirlíon

http://www.loc.gov/catdir/bios/wiley043/00025162.html
http://www.loc.gov/catdir/description/wiley035/00025162.html
http://www.loc.gov/catdir/toc/onix06/00025162.html

Míreanna Comhchosúla