Auciello, O., & Krauss, A. R. (2001). In situ real time characterization of thin films: Edited by Orlando Auciello, Alan R. Krauss. Wiley.
Chicago Edition CitationAuciello, Orlando, and Alan Robert Krauss. In Situ Real Time Characterization of Thin Films: Edited by Orlando Auciello, Alan R. Krauss. New York: Wiley, 2001.
MLA Edition CitationAuciello, Orlando, and Alan Robert Krauss. In Situ Real Time Characterization of Thin Films: Edited by Orlando Auciello, Alan R. Krauss. Wiley, 2001.
Warning: These citations may not always be 100% accurate.