Thin film analysis by X-ray scattering /

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Xehetasun bibliografikoak
Egile nagusia: Birkholz, Mario
Beste egile batzuk: Fewster, Paul F., Genzel, Christoph
Formatua: Printed Book
Argitaratua: Weinheim : Wiley-VCH, c2006.
Gaiak:
Thin films.
X-ray spectroscopy.
Sarrera elektronikoa:http://www.loc.gov/catdir/enhancements/fy0653/2006482582-b.html
http://www.loc.gov/catdir/enhancements/fy0653/2006482582-d.html
http://www.loc.gov/catdir/enhancements/fy0653/2006482582-t.html

Internet

http://www.loc.gov/catdir/enhancements/fy0653/2006482582-b.html
http://www.loc.gov/catdir/enhancements/fy0653/2006482582-d.html
http://www.loc.gov/catdir/enhancements/fy0653/2006482582-t.html

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