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Thin film analysis by X-ray scattering /
| Autor principal: | Birkholz, Mario |
|---|---|
| Outros Autores: | Fewster, Paul F., Genzel, Christoph |
| Formato: | Printed Book |
| Publicado em: |
Weinheim :
Wiley-VCH,
c2006.
|
| Assuntos: | |
| Acesso em linha: | http://www.loc.gov/catdir/enhancements/fy0653/2006482582-b.html http://www.loc.gov/catdir/enhancements/fy0653/2006482582-d.html http://www.loc.gov/catdir/enhancements/fy0653/2006482582-t.html |
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