Thin film analysis by X-ray scattering /

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Bibliographische Detailangaben
1. Verfasser: Birkholz, Mario
Weitere Verfasser: Fewster, Paul F., Genzel, Christoph
Format: Printed Book
Veröffentlicht: Weinheim : Wiley-VCH, c2006.
Schlagworte:
Thin films.
X-ray spectroscopy.
Online Zugang:http://www.loc.gov/catdir/enhancements/fy0653/2006482582-b.html
http://www.loc.gov/catdir/enhancements/fy0653/2006482582-d.html
http://www.loc.gov/catdir/enhancements/fy0653/2006482582-t.html

Online

http://www.loc.gov/catdir/enhancements/fy0653/2006482582-b.html
http://www.loc.gov/catdir/enhancements/fy0653/2006482582-d.html
http://www.loc.gov/catdir/enhancements/fy0653/2006482582-t.html

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