Thin film analysis by X-ray scattering /

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Bibliographische Detailangaben
1. Verfasser: Birkholz, Mario
Weitere Verfasser: Fewster, Paul F., Genzel, Christoph
Format: Printed Book
Veröffentlicht: Weinheim : Wiley-VCH, c2006.
Schlagworte:
Thin films.
X-ray spectroscopy.
Online Zugang:http://www.loc.gov/catdir/enhancements/fy0653/2006482582-b.html
http://www.loc.gov/catdir/enhancements/fy0653/2006482582-d.html
http://www.loc.gov/catdir/enhancements/fy0653/2006482582-t.html
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100 1 |a Birkholz, Mario. 
245 1 0 |a Thin film analysis by X-ray scattering /  |c Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel. 
260 |a Weinheim :  |b Wiley-VCH,  |c c2006. 
300 |a xxii, 356 p. :  |b ill. ; 
504 |a Includes bibliographical references and index. 
650 0 |a Thin films. 
650 0 |a X-ray spectroscopy. 
700 1 |a Fewster, Paul F. 
700 1 |a Genzel, Christoph. 
856 4 2 |u http://www.loc.gov/catdir/enhancements/fy0653/2006482582-b.html 
856 4 2 |u http://www.loc.gov/catdir/enhancements/fy0653/2006482582-d.html 
856 4 1 |u http://www.loc.gov/catdir/enhancements/fy0653/2006482582-t.html 
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