Birkholz, M., Fewster, P. F., & Genzel, C. (2006). Thin film analysis by X-ray scattering. Wiley-VCH.
シカゴスタイル引用形Birkholz, Mario, Paul F. Fewster, , Christoph Genzel. Thin Film Analysis by X-ray Scattering. Weinheim: Wiley-VCH, 2006.
MLA引用形式Birkholz, Mario, et al. Thin Film Analysis by X-ray Scattering. Wiley-VCH, 2006.
警告: この引用は必ずしも正確ではありません.