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Scanning probe microscopy of functional materials : nanoscale imaging and spectroscopy /

Xehetasun bibliografikoak
Beste egile batzuk: Kalinin, Sergei V., Gruverman, A.
Formatua: Printed Book
Argitaratua: New York : Springer, c2010.
Gaiak:
Scanning probe microscopy.
Scanning electron microscopy.
Nanotechnology.
Sarrera elektronikoa:http://www.loc.gov/catdir/enhancements/fy1114/2010938721-b.html
http://www.loc.gov/catdir/enhancements/fy1114/2010938721-d.html
http://www.loc.gov/catdir/enhancements/fy1114/2010938721-t.html
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Internet

http://www.loc.gov/catdir/enhancements/fy1114/2010938721-b.html
http://www.loc.gov/catdir/enhancements/fy1114/2010938721-d.html
http://www.loc.gov/catdir/enhancements/fy1114/2010938721-t.html

Antzeko izenburuak

  • Scanning probe microscopy: analytical methods
    nork: Wiesendanger, Roland; Editor
    Argitaratua: (1998)
  • Scanning probe microscopy of soft matter Fundamentals and practices
    nork: Tsukruk,Vladimir V
    Argitaratua: (2012)
  • Scanning probe microscopies beyond imaging: manipulation of molecules and nanostructures
    nork: Samori, Paolo; Editor
    Argitaratua: (2006)
  • Scanning probe microscopy: atomic scale engineering by forces and currents
    nork: Foster, A.
    Argitaratua: (2006)
  • Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale
    nork: Kalinin, Sergei
    Argitaratua: (2007)

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