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|a 8172248911
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| 020 |
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|a 8172248911
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| 082 |
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|a 621.395
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| 245 |
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|a Digital systems testing and testable design /
|c edited by Miron Abramovici
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| 260 |
|
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|a Mumbai:
|b Jaico Publishing,
|c 2001.
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| 300 |
|
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|a 652 p.
|
| 505 |
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|a 1. Modeling 2. Logic simulation 3. Fault modeling 4. Fault simulation 5. Testing for single stuck faults 6. Testing for bridging faults 7. Functional testing 8. Design for testability 9. Compression techniques 10. Built-in self-test 11. Logic-lev
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| 700 |
|
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|a Abramovici, Miron
|e editor.
|
| 942 |
|
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|c TXT
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| 999 |
|
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|c 53759
|d 53759
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| 952 |
|
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|0 0
|1 0
|4 0
|6 621_395000000000000_ABR_D
|7 0
|9 53737
|a UL
|b UL
|c SEC
|d 2012-10-27
|l 0
|o 621.395 ABR/D
|p 77062
|r 2012-10-27
|y TXT
|