Loading...

Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th birthday /

Bibliographic Details
Other Authors: Nakamura, Syouji (Editor)
Format: Printed Book
Language:English
Published: Singapore: world scientific, 2014.
Subjects:
Description
Item Description:Minimal Level Cataloging Plus.
Physical Description:xiv, 364 pages : illustrations ; 24 cm
Bibliography:Includes bibliographical references.
ISBN:9789814571937
9814571938