Hosmer, D. W., & Lemeshow, S. Applied Logistic Regression (Second.). John Wiley.
Chicago Edition CitationHosmer, David W., and Stanley Lemeshow. Applied Logistic Regression. Second. New York: John Wiley.
MLA引文Hosmer, David W., and Stanley Lemeshow. Applied Logistic Regression. Second. John Wiley.
警告:這些引文格式不一定是100%准確.