APA Alıntı

Hosmer, D. W., & Lemeshow, S. Applied Logistic Regression (Second.). John Wiley.

Chicago Stili Alıntı

Hosmer, David W., ve Stanley Lemeshow. Applied Logistic Regression. Second. New York: John Wiley.

MLA Alıntı

Hosmer, David W., ve Stanley Lemeshow. Applied Logistic Regression. Second. John Wiley.