Hosmer, D. W., & Lemeshow, S. Applied Logistic Regression (Second.). John Wiley.
Chicago Edition CitationHosmer, David W., and Stanley Lemeshow. Applied Logistic Regression. Second. New York: John Wiley.
ציטוט MLAHosmer, David W., and Stanley Lemeshow. Applied Logistic Regression. Second. John Wiley.
אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.