Hosmer, D. W., & Lemeshow, S. Applied Logistic Regression (Second.). John Wiley.
Chicago Edition CitationHosmer, David W., and Stanley Lemeshow. Applied Logistic Regression. Second. New York: John Wiley.
Deismireacht MLAHosmer, David W., and Stanley Lemeshow. Applied Logistic Regression. Second. John Wiley.
Rabhadh: D'fhéadfadh nach mbeadh na deismireachtaí seo 100% cruinn i gcónaí.