APA Zitierstil

Hosmer, D. W., & Lemeshow, S. Applied Logistic Regression (Second.). John Wiley.

Chicago Zitierstil

Hosmer, David W., und Stanley Lemeshow. Applied Logistic Regression. Second. New York: John Wiley.

MLA Zitierstil

Hosmer, David W., und Stanley Lemeshow. Applied Logistic Regression. Second. John Wiley.