APA استشهاد

Hosmer, D. W., & Lemeshow, S. Applied Logistic Regression (Second.). John Wiley.

استشهاد بنمط شيكاغو

Hosmer, David W., و Stanley Lemeshow. Applied Logistic Regression. Second. New York: John Wiley.

MLA استشهاد

Hosmer, David W., و Stanley Lemeshow. Applied Logistic Regression. Second. John Wiley.