High-resolution X-ray scattering : from thin films to lateral nanostructures /

Bibliografske podrobnosti
Glavni avtor: Pietsch, Ullrich
Drugi avtorji: Baumbach, Tilo, Holý, Václav
Format: Printed Book
Jezik:English
Izdano: New York : Springer, c2004.
Izdaja:2nd ed.
Teme:
Nanostructured materials.
Thin films > Optical properties.
X-rays > Diffraction.
X-rays > Scattering.
Online dostop:http://www.loc.gov/catdir/enhancements/fy0817/2003070360-t.html
http://www.loc.gov/catdir/enhancements/fy0817/2003070360-d.html

Internet

http://www.loc.gov/catdir/enhancements/fy0817/2003070360-t.html
http://www.loc.gov/catdir/enhancements/fy0817/2003070360-d.html

University of Calicut

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Signatura: 530.4175 PIE/H
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