High-resolution X-ray scattering : from thin films to lateral nanostructures /

Detalles Bibliográficos
Autor Principal: Pietsch, Ullrich
Outros autores: Baumbach, Tilo, Holý, Václav
Formato: Printed Book
Idioma:English
Publicado: New York : Springer, c2004.
Edición:2nd ed.
Subjects:
Nanostructured materials.
Thin films > Optical properties.
X-rays > Diffraction.
X-rays > Scattering.
Acceso en liña:http://www.loc.gov/catdir/enhancements/fy0817/2003070360-t.html
http://www.loc.gov/catdir/enhancements/fy0817/2003070360-d.html

Internet

http://www.loc.gov/catdir/enhancements/fy0817/2003070360-t.html
http://www.loc.gov/catdir/enhancements/fy0817/2003070360-d.html

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