High-resolution X-ray scattering : from thin films to lateral nanostructures /

Détails bibliographiques
Auteur principal: Pietsch, Ullrich
Autres auteurs: Baumbach, Tilo, Holý, Václav
Format: Printed Book
Langue:English
Publié: New York : Springer, c2004.
Édition:2nd ed.
Sujets:
Nanostructured materials.
Thin films > Optical properties.
X-rays > Diffraction.
X-rays > Scattering.
Accès en ligne:http://www.loc.gov/catdir/enhancements/fy0817/2003070360-t.html
http://www.loc.gov/catdir/enhancements/fy0817/2003070360-d.html

Internet

http://www.loc.gov/catdir/enhancements/fy0817/2003070360-t.html
http://www.loc.gov/catdir/enhancements/fy0817/2003070360-d.html

University of Calicut

Informations d'exemplaires de University of Calicut
Cote: 530.4175 PIE/H
Exemplaire Statut en temps réel indisponible

Documents similaires