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High-resolution X-ray scattering : from thin films to lateral nanostructures /

Bibliographic Details
Main Author: Pietsch, Ullrich
Other Authors: Baumbach, Tilo, Holý, Václav
Format: Printed Book
Language:English
Published: New York : Springer, c2004.
Edition:2nd ed.
Subjects:
Online Access:http://www.loc.gov/catdir/enhancements/fy0817/2003070360-t.html
http://www.loc.gov/catdir/enhancements/fy0817/2003070360-d.html
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100 1 |a Pietsch, Ullrich, 
245 1 0 |a High-resolution X-ray scattering :  |b from thin films to lateral nanostructures /  |c Ullrich Pietsch, Václav Holý, Tilo Baumbach. 
250 |a 2nd ed. 
260 |a New York :  |b Springer,  |c c2004. 
300 |a xvi, 408 p. :  |b ill. ;  |c 25 cm. 
504 |a Includes bibliographical references (p. [389]-402) and index. 
650 0 |a Nanostructured materials. 
650 0 |a Thin films  |x Optical properties. 
650 0 |a X-rays  |x Diffraction. 
650 0 |a X-rays  |x Scattering. 
700 1 |a Baumbach, Tilo, 
700 1 |a Holý, Václav, 
856 4 1 |u http://www.loc.gov/catdir/enhancements/fy0817/2003070360-t.html 
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