Á lódáil...
Computed elctron micrographs and defect identification/
| Príomhúdar: | |
|---|---|
| Formáid: | Printed Book |
| Foilsithe: |
N Y
North-Holland
1973
|
University of Calicut
| Gairmuimhir: |
530.41 HEA/C |
|---|---|
| Cóip | Live Status Unavailable |