Lanean...
Computed elctron micrographs and defect identification/
| Egile nagusia: | |
|---|---|
| Formatua: | Printed Book |
| Argitaratua: |
N Y
North-Holland
1973
|
University of Calicut
| Sailkapena: |
530.41 HEA/C |
|---|---|
| Alea | Egoera zuzenean ez dago erabilgarri |