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Computed elctron micrographs and defect identification/
| Autor principal: | |
|---|---|
| Formato: | Printed Book |
| Publicado em: |
N Y
North-Holland
1973
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| LEADER | 00423 a2200109 4500 | ||
|---|---|---|---|
| 082 | |a 530.41 HEA/C | ||
| 100 | |q Head A K | ||
| 245 | |a Computed elctron micrographs and defect identification/ |c by A K Head...et al | ||
| 260 | |a N Y |b North-Holland |c 1973 | ||
| 942 | |2 ddc |c BK | ||
| 999 | |c 166841 |d 166841 | ||
| 952 | |0 0 |1 0 |2 ddc |4 0 |6 530_410000000000000_HEA_C |7 0 |9 184289 |a PHY |b PHY |c ST1 |d 2010-05-19 |i 1382 |l 0 |o 530.41 HEA/C |p PHY1382 |r 2010-05-19 |w 2010-05-19 |y BK | ||