Head A K. (1973). Computed elctron micrographs and defect identification. North-Holland.
Chicago Edition CitationHead A K. Computed Elctron Micrographs and Defect Identification. N Y: North-Holland, 1973.
MLA Edition CitationHead A K. Computed Elctron Micrographs and Defect Identification. North-Holland, 1973.
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