Chargement en cours...
Scanning probe microscopy of soft matter fundamentals and practices /
| Auteur principal: | |
|---|---|
| Collectivité auteur: | |
| Autres auteurs: | |
| Format: | Printed Book |
| Langue: | English |
| Publié: |
Weinheim : Chichester :
Wiley-VCH ; John Wiley [distributor],
2011.
|
| Sujets: | |
| Accès en ligne: | http://dx.doi.org/10.1002/9783527639953 |
Table des matières:
- Front Matter
- Microscopy Fundamentals. Introduction
- Scanning Probe Microscopy Basics
- Basics of Atomic Force Microscopy Studies of Soft Matter
- Advanced Imaging Modes
- Probing Nanoscale Physical and Chemical Properties. Mechanical Properties of Polymers and Macromolecules
- Probing of Microthermal Properties
- Chemical and Electrical Properties
- Scanning Probe Optical Techniques
- Scanning Probe Techniques for Various Soft Materials. Amorphous and Poorly Ordered Polymers
- Organized Polymeric Materials
- Highly Branched Macromolecules
- Multicomponent Polymer Systems and Fibers
- Engineered Surface and Interfacial Materials
- Langmuir₂Blodgett and Layer-By-Layer Structures
- Colloids and Microcapsules
- Biomaterials and Biological Structures
- Nanomanipulation, Patterning, and Sensing. Scanning Probe Microscopy on Practical Devices
- Nanolithography with Intrusive AFM Tip
- Dip-Pen Nanolithography
- Microcantilever-Based Sensors
- Index.