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Trace analysis of semiconductor materials.
| Main Author: | |
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| Format: | Printed Book |
| Language: | English |
| Published: |
Oxford, New York,
Pergamon Press; [distributed in the Western Hemisphere by Macmillan, New York]
1964.
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| Series: | International series of monographs on analytical chemistry ;
v. 11. |
| Subjects: |
| Physical Description: | ix, 282 p. illus. 24 cm. |
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| Bibliography: | Includes bibliographies. |