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RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES
| Main Author: | |
|---|---|
| Format: | Printed Book |
| Published: |
Wiley
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| Edition: | 1st ED |
| Subjects: |
| LEADER | 00459nam a2200145 4500 | ||
|---|---|---|---|
| 082 | |a 621.382 | ||
| 100 | |a STRONG,ALVIN W | ||
| 245 | |a RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES |h [Text] | ||
| 250 | |a 1st ED | ||
| 260 | |b Wiley | ||
| 300 | |a 874p. | ||
| 650 | 0 | |a ELECTRICAL ENGINEERING | |
| 942 | |c BK | ||
| 999 | |c 84229 |d 84229 | ||
| 952 | |0 0 |1 0 |4 0 |6 621_382000000000000 |7 0 |9 76504 |a SOCS |b SOCS |d 2015-06-11 |g 6058.20 |l 0 |o 621.382 |p SOCS3588 |r 2015-06-11 |w 2015-06-11 |y BK | ||